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Developing a test generation tool for C programs

Dr. Micskei Zoltán Imre (MIT)
Verbőczy Kristóf (MSc degree, computer science and engineering programme, 2018-2019 Autumn)

Test Model Definition in TTCN-3

Dr. Erős Levente (TMIT)
Kriván Bálint (BSc degree, computer science and engineering programme, 2012-2013 Autumn)

Design and Implementation of a Test System for Brain Electrodes

Dr. Jobbágy Ákos Andor (MIT)
Németh Attila (MSc degree, biomedical engineering programme, 2012-2013 Autumn)

Development of a test platform for microfluidic devices

Dr. Ender Ferenc (EET)
Szabó Tibor (BSc degree, electrical engineering programme, 2013-2014 Spring)

Test system for DCU

Dr. Tóth Csaba (MIT)
Balaton György (MSc degree, electrical engineering programme, 2016-2017 Spring)

Building functional GUI regression test environment

Dr. Iváncsy Szabolcs (AUT)
Kövér Kristóf György (BSc degree, computer science and engineering programme, 2014-2015 Autumn)

Development of a testing environment for tachometer analysis

Dr. Sujbert László (MIT)
Rácz Dániel (BSc degree, electrical engineering programme, 2013-2014 Autumn)

Test System Development for Medical Equipment

Kökényesi Tamás (AUT)
Farkas Péter (MSc degree, electrical engineering programme, 2017-2018 Autumn)

Development of a Vehicle Center Display Testbench

Kovács Viktor (AUT)
Skublics Domonkos (BSc degree, electrical engineering programme, 2018-2019 Autumn)

Test coverage measurement in heterogeneous environments

Dr. Holczer Tamás (HIT)
Szám Tibor (BSc degree, computer science and engineering programme, 2017-2018 Spring)

Research and development of the improvement of test coverage

Dr. Fehér Béla (MIT)
Sztán Sebastian Tamás (BSc degree, electrical engineering programme, 2012-2013 Spring)

Developing a test environment for a railway demonstrator

Dr. Micskei Zoltán Imre (MIT)
Ecsedi Gergő (MSc degree, computer science and engineering programme, 2018-2019 Autumn)

Designing a Test Network for Analyzing Botnet Detection Algorithms

Dr. Fehér Gábor (TMIT)
Faragó Márton (5-grade degree, computer science and engineering programme (5-grade), 2010-2011 Autumn)

Test coverage measurement on a microcontroller

Dr. Kovácsházy Tamás (MIT)
Fitori Mátyás Bence (BSc degree, electrical engineering programme, 2015-2016 Spring)

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