Reliability analysis of semiconductor devices

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Supervisor:
Dr. Németh Pál
Department of Electronics Technology

During my academic studies I carried out the climatic test of the capacitors and then the resistors. Therefore in this thesis, I aimed at the examination of the diodes and transistors from the semiconductors. In the introduction of my thesis, I summarized the subtypes and common configurations of the pn-junction, diodes and transistors. After that I analyzed the main points of AEC Q101 and Q200 standards, which is the standardization body for establishing standards for reliable, high quality electronic components. I collected the methods and their typical practises of the climatic and reliability inspections. On the basis of the familiar climatic inspections, I prepared an analysis plan. For the execution of the measurements I made measuring panel. After completing the measurements, I documented and evaluated the results. As a conclusion, I illustrated a possible technique for examining the transistors before applying them. With this technique the user and the engineer are able to find the most suitable testing methods.

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