The purpose of this paper is to introduce the development of the ESEO (European Student Earth Orbiter) satellite's Electrical Power Subsystem's (EPS) Power Control Unit (PCU) and the Total Ionizing Dose (TID) test of a non-radiation tolerant Field-Programmable Gate Array (FPGA) which contains the designed circuit.
The accumulation of charged particles within the silicon-dioxide (SiO2) can lead to semi-permanent effects like voltage shift, current leakage and speed degradation. The expected worst case TID in the mission is 10krad(Si). Experience shows that at this dose rate high current leakage can be measured at Commercial-Of-The-Shelf (COTS) MOS devices but functional failure is highly unlikely.
The paper will start with the introduction of the ESEO satellite’s subsystems and payloads, and it will give a detailed description of the EPS. After the general introduction of the project, the requirements of the PCU and the selected components will be shown. In the third chapter the designed circuit and test results will be presented. In the final chapter of the paper the test setup of the circuit and the used test method will be explained.
The motivation of this experiment is to prove that the flash based - ProASIC3 A3P600 - non-radiation tolerant FPGA can be used in a space environment. To execute the experiment a test setup required to measure the degradation of the FPGA and its effect on the PCU’s functionality.