Up to our present days the need for information and the complexity of electrical devices multiplied compared to recent decades.
One fundamental circuitry which can attend the high demand for information is the High-Speed Serial Interface (HSSI).
These interfaces are highly complex and often extensively configurable to bridge signal integrity problems but this fact
prolongs their necessary test time. The inspection of these interfaces requires special and costly instruments and
simulation software tools.
The goal of my thesis is to present a cost-effective method to examine the serial interfaces. First I review the basic
concept of high speed serial interfaces and the main quality checking measurements. The topic of signal integrity
problems is also touched.
I introduce the typical circuitry elements, structure and configurable parameters of serial interfaces through
the serial interface which was used. I review the advantages and drawbacks of circuitry elements which affect
signal integrity quality.
I discuss the current methods of examination and characterization of high-speed serial interfaces. I also represent
the results of inexpensive characterisation methods of my choice. I introduce my own characterization printed
circuit board, which was used to test the available Xilinx FPGA serial interface. I review the results of characterisation
of the test board and with the help of some expressive examples I comment the results. I conclude the FPGA IBERT
IP Core measurement results and the effects of transceiver parameters on the signals. Finally I contrast the measurement
results with the simulation results and examine the accordance of them.
For the closure of my thesis I compare the results of different methods. Based on my results I also review the effect of
most common signal integrity problems and the most effective compensation methods of these effects. Lastly I conclude
my thoughts in touch with the measurements and methods.