Analysis of high-speed serial interfaces

OData support
Supervisor:
Szántó Péter
Department of Measurement and Information Systems

Up to our present days the need for information and the complexity of electrical devices multiplied compared to recent decades.

One fundamental circuitry which can attend the high demand for information is the High-Speed Serial Interface (HSSI).

These interfaces are highly complex and often extensively configurable to bridge signal integrity problems but this fact

prolongs their necessary test time. The inspection of these interfaces requires special and costly instruments and

simulation software tools.

The goal of my thesis is to present a cost-effective method to examine the serial interfaces. First I review the basic

concept of high speed serial interfaces and the main quality checking measurements. The topic of signal integrity

problems is also touched.

I introduce the typical circuitry elements, structure and configurable parameters of serial interfaces through

the serial interface which was used. I review the advantages and drawbacks of circuitry elements which affect

signal integrity quality.

I discuss the current methods of examination and characterization of high-speed serial interfaces. I also represent

the results of inexpensive characterisation methods of my choice. I introduce my own characterization printed

circuit board, which was used to test the available Xilinx FPGA serial interface. I review the results of characterisation

of the test board and with the help of some expressive examples I comment the results. I conclude the FPGA IBERT

IP Core measurement results and the effects of transceiver parameters on the signals. Finally I contrast the measurement

results with the simulation results and examine the accordance of them.

For the closure of my thesis I compare the results of different methods. Based on my results I also review the effect of

most common signal integrity problems and the most effective compensation methods of these effects. Lastly I conclude

my thoughts in touch with the measurements and methods.

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