Optimizing flying probe tests in the industrial environment of electronic manufacturing

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Dr. Géczy Attila
Department of Electronics Technology

The aim of my thesis is to explore, realize and examine the optimization possibilities of the flying probe test equipment’s test programs. The in-circuit testing is the most common form of quality assurance in electronic manufacturing. One type of it is the flying probe testing. Besides it can provide more flexibile testing opportunities over the other processes, it’s main drawback is the long testing time. In addition to increase efficiency, reducing testing time is the main motivation of my thesis.

I realized the tests and measurements on a SPEA Multimode 4040 test equipment and I generated the test programs with the use of SPEA Leonardo Advanced software environment. This equipment was used in an electronic manufacture in production environment, so I could make my researches directly under industrial conditions. While I optimized the test programs I constantly kept in mind the principles and standards of quality assurance in electronic manufacturing.

My thesis generally presents control methods in electronic assembly technology and demonstrates the properties, assets and opeartion of flying probe testing. I examined the optimization opportunities the following aspects. Changing order or abandoning steps in the test program, reducing guarding processes and measurement times, using different positioning strategies, abandoning mobile holders, effects of optical inspection and electro-scan method on testing. While interpreting the results and drawing the conclusions I present the efficiency, limits and effects of the tested methods on the flying probe testing.


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