In the present, newly developed electrical devices’ power density increases. The reliability and the lifetime of these devices are important. This fact developed the need of thermal transient measurements.
In this paper I summarize the theory of JEDEC JESD-51 industry standard. It describes the two thermal transient measurement methods: static and dynamic measurements.
The objective was to design a control software that can operate the Mentor Graphics’s T3Ster measurement hardware, to measure the thermal transient with the standard’s dynamic method.
With this newly developed software I measured different kind of devices with these two methods, and the results were compared.
After this, I examined high power supplies from the point of view of switch transient. To do this a control unit was developed, and built for the thermal transient platform. The measurements were done in this system.
I designed a curve tracer for the thermal transient platform. The curve tracer can examine two- and three-terminal devices, and it operates in impulse mode. I made different kind of measurements to prove that the thermal transient platform can operate as a curve tracer, and I examined how the impulse waveforms influenced the examined device’s curve.