Research and development of the improvement of test coverage

OData support
Supervisor:
Dr. Fehér Béla
Department of Measurement and Information Systems

Testing electronic products is getting more and more challenging nowadays when considering the miniaturization of devices that induces printed circuit boards and components the reduction of size which lead today to a raising amount of difficulties when concerning the increase of test coverage required as early as possible in production to sustain cost reduction in order to gain incomings to a company having a large amount of employees to keep the economy in function.

The goal of the project deals with the implementation of indispensable functions of the recent in-circuit test interface keeping in mind the abilities for improvement and further extensions.

The project covers getting familiar with boundary scan description language, the related IEEE 1149.1 and IEEE 1149.6 standards, the in-circuit test development environment, the software and solutions utilized by the TestStations of Teradyne. The project involves the implementation of the tool – including some restrictions – that help engineers to identify and handle issues to increase test coverage related to later standards that are used now in the graphical environment of LabVIEW provided by National Instruments. The project also comprises testing the program and the documentation of the developed code, marking further applications.

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